- Packaging :
- Output Type :
- Logic Type :
-
- 8-Bit to 9-Bit Parity Bus Transceiver (4)
- Addressable Scan Ports (4)
- Arithmetic Logic Unit (6)
- Buffer, Inverting (10)
- Buffer, Non-Inverting (48)
- Buffer/Driver with Parity (2)
- Embedded Test-Bus Controllers (4)
- Scan Test Device with Buffers (3)
- Scan Test Device with Bus Transceivers (5)
- Scan Test Device with D-Type Edge-Triggered Flip-Flops (4)
- Scan Test Device with D-Type Latches (4)
- Scan Test Device with Inverting Buffers (4)
- Transceiver, Inverting (58)
- Transceiver, Non-Inverting (329)
- Voltage Clamp (2)
- Voltage - Supply :
- Supplier Device Package :
- Current - Output High, Low :
-
- -, 188mA; 3mA, 24mA (2)
- -, 24mA; 15mA, 24mA (5)
- 12mA, 12mA (2)
- 12mA, 12mA; 24mA, 24mA (5)
- 15mA, 12mA (8)
- 15mA, 24mA (40)
- 15mA, 48mA (22)
- 15mA, 64mA (20)
- 1mA, 12mA (2)
- 24mA, 24mA (115)
- 24mA, 48mA (28)
- 24mA, 64mA (4)
- 32mA, 32mA (2)
- 32mA, 64mA (124)
- 3mA, 24mA (3)
- 3mA, 24mA; 12mA, 64mA (4)
- 3mA, 24mA; 15mA, 64mA (7)
- 3mA, 24mA; 3mA, 64mA (3)
- 3mA, 64mA (2)
- 6mA, 6mA (17)
- 7.8mA, 7.8mA (11)
- 80mA, 188mA (8)
- 80mA, 188mA; 32mA, 64mA (4)
- 80mA, 188mA; 3mA, 24mA (7)
11 products
IMAGE | PART NO. | PRICE | QUANTITY | STOCK | MANUFACTURE | DESCRIPTION | Package / Case | Series | Packaging | Input Type | Output Type | Logic Type | Mounting Type | Number of Elements | Operating Temperature | Part Status | Voltage - Supply | Supplier Device Package | Number of Bits per Element | Current - Output High, Low | Factory Stock | @ qty | Minimum Quantity | |
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Texas Instruments | IC SCAN TEST DEVICE 24SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tape & Reel (TR) | Scan Test Device with D-Type Edge-Triggered Flip-Flops | Surface Mount | 0°C ~ 70°C | Obsolete | 24-SOIC | 0 | 0 | 2000 | |||||||||||
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Texas Instruments | IC SCAN TEST DEVICE 24SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tape & Reel (TR) | Scan Test Device with D-Type Latches | Surface Mount | 0°C ~ 70°C | Obsolete | 24-SOIC | 0 | 0 | 2000 | |||||||||||
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Texas Instruments | IC SCAN TEST DEVICE 24SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tape & Reel (TR) | Scan Test Device with Inverting Buffers | Surface Mount | 0°C ~ 70°C | Obsolete | 24-SOIC | 0 | 0 | 2000 | |||||||||||
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Texas Instruments | IC TRANSCEIVER 1-9BIT 24SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tape & Reel (TR) | 8-Bit to 9-Bit Parity Bus Transceiver | Surface Mount | 0°C ~ 70°C | Obsolete | 24-SOIC | 0 | 0 | 2000 | |||||||||||
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Texas Instruments | IC ARITHMETIC LOGIC UNIT 24SOIC | 24-SOIC (0.295", 7.50mm Width) | 74AS | Tape & Reel (TR) | Arithmetic Logic Unit | Surface Mount | 0°C ~ 70°C | Obsolete | 24-SOIC | 0 | 0 | 2000 | |||||||||||
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Texas Instruments | IC ARITHMETIC LOGIC UNIT 24SOIC | 24-SOIC (0.295", 7.50mm Width) | 74AS | Tube | Arithmetic Logic Unit | Surface Mount | 0°C ~ 70°C | Obsolete | 24-SOIC | 0 | 0 | ||||||||||||
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Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tape & Reel (TR) | Scan Test Device with D-Type Edge-Triggered Flip-Flops | Surface Mount | 0°C ~ 70°C | Obsolete | 24-SOIC | 0 | 0 | 2000 | |||||||||||
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Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tape & Reel (TR) | Scan Test Device with D-Type Edge-Triggered Flip-Flops | Surface Mount | 0°C ~ 70°C | Obsolete | 24-SOIC | 0 | 0 | 2000 | |||||||||||
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tape & Reel (TR) | Scan Test Device with D-Type Latches | Surface Mount | 0°C ~ 70°C | Obsolete | 24-SOIC | 0 | 0 | 2000 | |||||||||||
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Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tape & Reel (TR) | Scan Test Device with D-Type Latches | Surface Mount | 0°C ~ 70°C | Obsolete | 24-SOIC | 0 | 0 | 2000 | |||||||||||
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Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tape & Reel (TR) | Scan Test Device with Buffers | Surface Mount | 0°C ~ 70°C | Discontinued at Digi-Key | 24-SOIC | 0 | 0 | 2000 | |||||||||||
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Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tape & Reel (TR) | Scan Test Device with Inverting Buffers | Surface Mount | 0°C ~ 70°C | Obsolete | 24-SOIC | 0 | 0 | 2000 | |||||||||||
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Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tape & Reel (TR) | Scan Test Device with Inverting Buffers | Surface Mount | 0°C ~ 70°C | Obsolete | 24-SOIC | 0 | 0 | 2000 | |||||||||||
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Texas Instruments | IC TRANSCEIVER 1-9BIT 24SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tape & Reel (TR) | 8-Bit to 9-Bit Parity Bus Transceiver | Surface Mount | 0°C ~ 70°C | Obsolete | 24-SOIC | 0 | 0 | 2000 | |||||||||||
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Texas Instruments | IC TRANSCEIVER 1-9BIT 24SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tape & Reel (TR) | 8-Bit to 9-Bit Parity Bus Transceiver | Surface Mount | 0°C ~ 70°C | Obsolete | 24-SOIC | 0 | 0 | 2000 | |||||||||||
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Texas Instruments | IC ARITHMETIC LOGIC UNIT 24-SOIC | 24-SOIC (0.295", 7.50mm Width) | 74AS | Tape & Reel (TR) | Arithmetic Logic Unit | Surface Mount | 0°C ~ 70°C | Obsolete | 24-SOIC | 0 | 0 | 2000 | |||||||||||
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Texas Instruments | IC ARITHMETIC LOGIC UNIT 24-SOIC | 24-SOIC (0.295", 7.50mm Width) | 74AS | Tape & Reel (TR) | Arithmetic Logic Unit | Surface Mount | 0°C ~ 70°C | Obsolete | 24-SOIC | 0 | 0 | 2000 | |||||||||||
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Texas Instruments | IC ARITHMETIC LOGIC UNIT 24-SOIC | 24-SOIC (0.295", 7.50mm Width) | 74AS | Tube | Arithmetic Logic Unit | Surface Mount | 0°C ~ 70°C | Obsolete | 24-SOIC | 0 | 0 | ||||||||||||
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Texas Instruments | IC ARITHMETIC LOGIC UNIT 24-SOIC | 24-SOIC (0.295", 7.50mm Width) | 74AS | Tube | Arithmetic Logic Unit | Surface Mount | 0°C ~ 70°C | Obsolete | 24-SOIC | 0 | 0 | ||||||||||||
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Texas Instruments | IC ADDRESSABLE SCAN PORT 24-SOIC | 24-SOIC (0.295", 7.50mm Width) | 74ABT | Tape & Reel (TR) | Addressable Scan Ports | Surface Mount | -40°C ~ 85°C | Obsolete | 24-SOIC | 0 | 0 | 2000 | |||||||||||
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NXP USA Inc. | IC BUFFER/LDRIVER OCTAL 24SOIC | 24-SOIC (0.295", 7.50mm Width) | 74F | Tube | Buffer/Driver with Parity | Surface Mount | 0°C ~ 70°C | Obsolete | 24-SO | 0 | 0 | 1200 | |||||||||||
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NXP USA Inc. | IC BUFFER/DRIVER OCTAL 24SOIC | 24-SOIC (0.295", 7.50mm Width) | 74F | Tape & Reel (TR) | Buffer/Driver with Parity | Surface Mount | 0°C ~ 70°C | Obsolete | 24-SO | 0 | 0 | ||||||||||||
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Texas Instruments | IC TEST-BUS CONTROLLER 24-SOIC | 24-SOIC (0.295", 7.50mm Width) | 74LVT | Tube | Embedded Test-Bus Controllers | Surface Mount | -40°C ~ 85°C | Active | 24-SOIC | 7475 | 0 | ||||||||||||
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Texas Instruments | IC ADDRESSABLE SCAN PORT 24-SOIC | 24-SOIC (0.295", 7.50mm Width) | 74ABT | Tube | Addressable Scan Ports | Surface Mount | -40°C ~ 85°C | Active | 160-NFBGA (9x13) | 3850 | 0 | ||||||||||||
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Texas Instruments | IC 10-BIT SCAN PORT XCVR 24-SOIC | 24-SOIC (0.295", 7.50mm Width) | 74LVT | Tube | Addressable Scan Ports | Surface Mount | -40°C ~ 85°C | Active | 24-SOIC | 4075 | 0 | ||||||||||||
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Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tube | Scan Test Device with Buffers | Surface Mount | 0°C ~ 70°C | Active | 24-SOIC | 0 | 0 | ||||||||||||
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Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tube | Scan Test Device with Bus Transceivers | Surface Mount | 0°C ~ 70°C | Active | 24-SOIC | 1300 | 0 | ||||||||||||
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Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tube | Scan Test Device with D-Type Latches | Surface Mount | 0°C ~ 70°C | Active | 24-SOIC | 800 | 0 | 75 | |||||||||||
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Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tube | Scan Test Device with Inverting Buffers | Surface Mount | 0°C ~ 70°C | Active | 24-SOIC | 525 | 0 | 75 | |||||||||||
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Texas Instruments | IC TEST-BUS CONTROLLER 24-SOIC | 24-SOIC (0.295", 7.50mm Width) | 74LVT | Tape & Reel (TR) | Embedded Test-Bus Controllers | Surface Mount | -40°C ~ 85°C | Active | 24-SOIC | 8000 | 0 | 2000 |