- Packaging :
- Part Status :
4 products
| IMAGE | PART NO. | PRICE | QUANTITY | STOCK | MANUFACTURE | DESCRIPTION | Package / Case | Series | Packaging | Number of Bits | Logic Type | Mounting Type | Operating Temperature | Part Status | Supplier Device Package | Factory Stock | Minimum Quantity | Supply Voltage | |
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Texas Instruments | IC SCAN TEST DEVICE 24SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tape & Reel (TR) | Scan Test Device with D-Type Edge-Triggered Flip-Flops | Surface Mount | 0°C ~ 70°C | Obsolete | 24-SOIC | 0 | 2000 | 4.5 V ~ 5.5 V | |||||
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Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tape & Reel (TR) | Scan Test Device with D-Type Edge-Triggered Flip-Flops | Surface Mount | 0°C ~ 70°C | Obsolete | 24-SOIC | 0 | 2000 | 4.5 V ~ 5.5 V | |||||
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Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tape & Reel (TR) | Scan Test Device with D-Type Edge-Triggered Flip-Flops | Surface Mount | 0°C ~ 70°C | Obsolete | 24-SOIC | 0 | 2000 | 4.5 V ~ 5.5 V | |||||
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Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tube | Scan Test Device with D-Type Edge-Triggered Flip-Flops | Surface Mount | 0°C ~ 70°C | Active | 24-SOIC | 0 | 4.5 V ~ 5.5 V |